A Digital Self-Testable Wave Generator Core for Analog Signals
نویسنده
چکیده
This paper focuses test strategy for integrated circuits mainly mixed signal ones. The aim is the development of circuits that can help the test of integrated circuits, especially of MADBIST, in which it is necessary, a high quality analog signal easily configurable and easily integrated in silicon. These circuits can be inserted into any microprocessor or circuit, as a Core. For this system, which generates test signals for analog components, to be complete, it is necessary that it also be self-testable. For this reason, BIST circuitry has been inserted into the waveform generator.
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